journal article·2024-08Open access

Atomic Layer Deposition Films for Resistive Random‐Access Memories (Adv. Mater. Technol. 16/2024)

Chunxue Hao, Jun Peng, Robert Zierold, Robert H. Blick

Advanced Materials Technologies· Volume 9· Issue 16

Abstract

Atomic Layer Deposition Films Resistive random-access memory (RRAM) is a promising technology because of its ease of operation, high speed, affordability, and stability, particularly at nanoscale device sizes. In article number 2301762, Robert Zierold an o-workers show that atomic layer deposition is ideal for RRAM fabrication due to its ability to control oxygen vacancies and enables multiple-layer stacking, with potential applications in information storage and neural networks.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Semiconductor materials and devices · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Center for Hybrid Nanostructures Universität Hamburg Luruper Chaussee 149 22761 Hamburg Germany

References

Reference metadata was not supplied for this record.