A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy (Adv. Mater. Technol. 5/2025)
Source abstract
Abstract
Scanning Transmission Electron Microscopy In article number 2401208, Ondrej Dyck and co-workers present a laser system that allows laser irradiation to a sample as well as ablation of a nearby target to deposit material onto the sample. This work represents the first steps toward integrating synthesis processes with electron beam induced sample modification.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Laser Material Processing Techniques
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Affiliations
Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN USA
Department of Physics and Astronomy University of Tennessee Knoxville TN USA
Waviks Incorporated Dallas TX USA
References
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