A Novel Large‐Scale, Multilayer, and Facilely Aligned Micropatterning Technique Based on Flexible and Reusable SU‐8 Shadow Masks
Source abstract
Abstract
Abstract A simple method to fabricate flexible, mechanically robust, and reusable SU‐8 shadow masks is demonstrated. This shadow mask technology has high pattern flexibility as various shapes with different dimensions can be created. The fabricated shadow masks are characterized in terms of the resolution, reusability, and capability of multilayer surface micropatterning. Fabrication of a new plastic photomask for the exposure process simplifies the shadow mask fabrication process and results in higher resolution in the shadow mask structures compared to the commercial chromium photomasks. For the multilayer surface micropatterning technology, a simple and fast alignment technique based on SU‐8 pillars and without usage of any microscopic tools is reported. This unique method leads to a less complicated alignment process with the alignment accuracy of ≈2 µm. The proposed shadow mask technology can be easily employed for wafer‐scale micropatterning process. The capability of fabricated SU‐8 shadow masks in micropatterning on polymer thin films is evaluated by fabricating metallic contacts on poly(3,4‐ethylenedioxythiophene) samples and electrical characterization.
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Research context
OpenAlex topics: Advancements in Photolithography Techniques · Nanofabrication and Lithography Techniques · Advanced MEMS and NEMS Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Material Systems for Nanoelectronics Chemnitz University of Technology Reichenhainer Straße 70 09107 Chemnitz Germany
Center for Materials Architectures and Integration of Nanomembranes (MAIN) Chemnitz University of Technology Rosenberg Str. 6 09126 Chemnitz Germany
Institute for Integrative Nanosciences Leibniz IFW Dresden Helmholtzstraße 20 01069 Dresden Germany
Funding
European Social Fund · Deutsche Forschungsgemeinschaft
References (46)
Show source-provided references
1. 10.1126/science.290.5496.153210.1126/science.290.5496.1532 ↗
2. 10.1016/S0167-9317(00)00343-910.1016/S0167-9317(00)00343-9 ↗
3. 10.1021/cr050139y10.1021/cr050139y ↗
4. 10.1016/j.mee.2014.08.00310.1016/j.mee.2014.08.003 ↗
5. 10.1016/j.proche.2009.07.19010.1016/j.proche.2009.07.190 ↗
6. 10.1021/nn301358n10.1021/nn301358n ↗
7. 10.1016/j.mee.2012.07.04810.1016/j.mee.2012.07.048 ↗
8. 10.1016/j.mee.2010.12.11710.1016/j.mee.2010.12.117 ↗
9. 10.1088/0960-1317/20/7/07503710.1088/0960-1317/20/7/075037 ↗
10. 10.1021/nl034512y10.1021/nl034512y ↗
11. 10.1021/nl101042a10.1021/nl101042a ↗
12. 10.1039/c1ra00520k10.1039/c1ra00520k ↗
13. 10.1088/0960-1317/10/2/31010.1088/0960-1317/10/2/310 ↗
14. 10.1016/j.sna.2016.02.04010.1016/j.sna.2016.02.040 ↗
15. 10.1016/j.mee.2010.11.05610.1016/j.mee.2010.11.056 ↗
16. 10.1002/adma.20110016310.1002/adma.201100163 ↗
17. 10.1039/C2NR11609J10.1039/C2NR11609J ↗
18. 10.1088/0957-4484/25/44/44530110.1088/0957-4484/25/44/445301 ↗
19. Ghadarghadr S. · J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.–Process., Meas., Phenom. · 2011 · 29 · 06F40110.1116/1.3628672 ↗
20. 10.1002/adma.20140413310.1002/adma.201404133 ↗
21. 10.1088/0960-1317/15/2/00310.1088/0960-1317/15/2/003 ↗
22. 10.1364/AO.53.00019510.1364/AO.53.000195 ↗
23. 10.1007/s12541-009-0021-410.1007/s12541-009-0021-4 ↗
24. 10.1007/s40684-015-0026-710.1007/s40684-015-0026-7 ↗
25. 10.1007/s00170-007-0967-210.1007/s00170-007-0967-2 ↗
26. 10.3390/mi804013110.3390/mi8040131 ↗
27. 10.1088/0960-1317/19/4/04502410.1088/0960-1317/19/4/045024 ↗
28. 10.1002/1097-4636(200011)52:2<346::AID-JBM14>3.0.CO;2-H10.1002/1097-4636(200011)52:2<346::AID-JBM14>3.0.CO;2-H ↗
29. 10.1016/j.sna.2007.10.05310.1016/j.sna.2007.10.053 ↗
30. 10.1002/pi.583410.1002/pi.5834 ↗
31. 10.1002/adma.20130092010.1002/adma.201300920 ↗
32. 10.1038/srep2489010.1038/srep24890 ↗
33. 10.1063/1.486426910.1063/1.4864269 ↗
34. 10.1088/1742-6596/757/1/01202110.1088/1742-6596/757/1/012021 ↗
35. Sowmya N. · 2015
36. 10.1088/0960-1317/23/2/02500910.1088/0960-1317/23/2/025009 ↗
37. Du K. · J. Vac. Sci. Technol., B: Nanotechnol. Microelectron.: Mater., Process., Meas., Phenom. · 2013 · 31 · 06FF04
38. 10.1116/1.475711010.1116/1.4757110 ↗
39. 10.1039/b820955c10.1039/b820955c ↗
40. 10.1109/JMEMS.2004.83836810.1109/JMEMS.2004.838368 ↗
41. 10.1016/S0924-4247(03)00298-X10.1016/S0924-4247(03)00298-X ↗
42. 10.1088/0960-1317/20/8/08501110.1088/0960-1317/20/8/085011 ↗
43. 10.1039/b500519a10.1039/b500519a ↗
44. 10.1088/0960-1317/12/5/31210.1088/0960-1317/12/5/312 ↗
45. 10.1039/b403304c10.1039/b403304c ↗
46. 10.1016/S0924-4247(98)00286-610.1016/S0924-4247(98)00286-6 ↗