Multiparameter Closed‐Loop Control to Advance Reliability of Aerosol Jet Printing

Abstract Aerosol jet printing is an emerging technology for printed electronics, offering high‐resolution, noncontact deposition on complex surfaces with broad material compatibility. However, process variability remains a critical challenge in aerosol jet printing, limiting its broader adoption for industrial applications. In this work, a multiparameter closed‐loop control framework is developed and validated that significantly improves process stability over extended print durations. In situ light scattering measurements are used to monitor aerosol volume fraction in real time and serve as the feedback signal for two independently tuned parallel control loops. Dynamic response testing reveals the temporal characteristics of each control parameter, enabling the design of targeted control strategies. A slow response loop modulates atomizer voltage to suppress long‐term drift in atomization, while a fast response loop adjusts carrier gas flow rate or feed rate to reduce short‐term variability. Compared to open‐loop printing, the multiparameter control approach reduces the relative standard deviation of electrical conductance in printed samples from 42% to 5% and reduces drift from 25% h ⁻¹ to 3% h ⁻¹ over a three hour print. This work advances process control in aerosol jet printing systems and demonstrates a strategy for improving manufacturing reliability for printed electronics.