Silver Thin‐Film Electrodes Grown by Low‐Temperature Plasma‐Enhanced Spatial Atomic Layer Deposition at Atmospheric Pressure
Source abstract
Abstract
Abstract The unique properties of atomic layer deposition (ALD) are mainly exploited for metal oxides, while the growth of metals, such as silver, is still in its infancy. Low growth temperatures and high growth rates are essential to achieve conductive (i.e. percolated) films. Here, a study based on the authors’ recently introduced N‐heterocyclic carbene‐based Ag amide precursor [(NHC)Ag(hmds)] (1,3‐di‐tert‐butyl‐imidazolin‐2‐ylidene silver(I) 1,1,1‐trimethyl‐N‐(trimethylsilyl) silanaminide) using plasma‐enhanced spatial ALD at atmospheric pressure and at deposition temperatures as low as 60 °C, is provided. The favorable reactivity and high volatility of the [(NHC)Ag(hmds)] precursor affords high growth rates up to 3.4 × 1014 Ag atoms cm–2 per cycle, which are ≈2.5 times higher than that found with the established triethylphosphine(6,6,7,7,8,8,8‐heptafluoro‐2,2‐dimethyl‐3,5‐octanedionate) silver(I) [Ag(fod)(PEt3)] precursor. Consequently, highly conductive Ag films with resistivities as low as 2.7 µΩ cm are achieved at a deposition temperature of 100 °C with a percolation threshold of ≈2.6 × 1017 Ag atoms cm–2, which is more than 1.6 times lower compared to [Ag(fod)(PEt3)]. As a concept study, conductive Ag layers are used as bottom electrodes in organic solar cells, that achieve the same performance as those based on Ag electrodes resulting from a high vacuum process.
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Research context
OpenAlex topics: Semiconductor materials and devices · Organic Light-Emitting Diodes Research · Advanced Memory and Neural Computing
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of Electronic Devices and Wuppertal Center for Smart Materials & Systems University of Wuppertal 42119 Wuppertal Germany
Inorganic Materials Chemistry Ruhr University Bochum 44801 Bochum Germany
RUBION Ruhr University Bochum 44801 Bochum Germany
Carl Zeiss Microscopy GmbH 73447 Oberkochen Germany
Funding
Deutsche Forschungsgemeinschaft · Bundesministerium für Bildung und Forschung · Horizon 2020 Framework Programme
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