journal article·2017-05

Selective Surface Smoothening of Polymer Microlenses by Depth Confined Softening

Nachiappan Chidambaram, Robert Kirchner, Roberto Fallica, Libo Yu, Mirco Altana, Helmut Schift

Advanced Materials Technologies· Volume 2· Issue 5
Publisher page

Abstract

Polymeric refractive micro‐optical devices simultaneously demand striking smooth 3D topographies and precise shape accuracy for high performance and low stray light. Here, a surface selective smoothening of thermoplastic, polymeric material has been established while maintaining the high curvature corners required for a 50 µm tall, refractive, optical diffuser device. The 3D master structures are fabricated using direct write laser‐lithography with two‐photon absorption. Master structures are replicated into poly(methyl methacrylate) through a poly(dimethyl siloxane) intermediate copying step and subsequently smoothed out. Here, various high‐energy radiations have been considered to have a surface selective exposure and have been narrowed down to 172 nm ultraviolet exposure to be the ideal fit for this application. The 172 nm exposure provides selective modification of an up to 400 nm thick surface skin layer and negligible etching, which allows smoothening out up to 420 nm surface steps and reducing the RMS roughness from 22 nm down to below 10 nm by thermally driven material displacement, the so–called reflow, on a global pattern scale. Extreme ultraviolet exposure, as an alternative method, shows a higher modification efficiency than the 172 nm but has severe practical limitations.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Nonlinear Optical Materials Studies · Nanofabrication and Lithography Techniques · Advanced optical system design

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Paul Scherrer Institute Laboratory for Micro‐ and Nanotechnology 5232 Villigen PSI Switzerland

Heptagon Oy Moosstrasse 2 8803 Rüschlikon Switzerland

Funding

Swiss Nanoscience Institute

References (64)

Show source-provided references
1. Levallois C. · Proc. SPIE · 2008 · 69920
2. 10.1049/el:1991015410.1049/el:19910154 ↗
3. 10.1088/0963-9659/6/6/00410.1088/0963-9659/6/6/004 ↗
4. 10.1364/OE.18.01425110.1364/OE.18.014251 ↗
5. 10.1117/1.180355410.1117/1.1803554 ↗
6. Ezell B. · Inf. Dis. · 2001 · 17 · 42
7. 10.1063/1.143542210.1063/1.1435422 ↗
8. 10.1063/1.191496010.1063/1.1914960 ↗
9. Hettler N. · Laser Focus World · 2014 · 12 · 53
10. 10.1116/1.151530510.1116/1.1515305 ↗
11. 10.1117/12.93539710.1117/12.935397 ↗
12. 10.1364/AO.34.00750710.1364/AO.34.007507 ↗
13. 10.1364/AO.27.00128110.1364/AO.27.001281 ↗
14. 10.1016/0167-9317(86)90004-310.1016/0167-9317(86)90004-3 ↗
15. 10.1016/S0924-4247(98)80055-110.1016/S0924-4247(98)80055-1 ↗
16. 10.1016/S0167-9317(00)00363-410.1016/S0167-9317(00)00363-4 ↗
17. 10.3390/mi601000110.3390/mi6010001 ↗
18. 10.1016/j.snb.2010.10.02110.1016/j.snb.2010.10.021 ↗
19. 10.1088/0960-1317/21/1/01700310.1088/0960-1317/21/1/017003 ↗
20. Schuster C. · Abstract in programme of the 41st Int. Conf. Micro‐ and Nanoengineering (MNE), The Hague, NL · 2015 · 1
21. Ma X. · Proc. SPIE · 2015 · 9426 · 94260F
22. 10.1007/s00339-015-9106-310.1007/s00339-015-9106-3 ↗
23. 10.1364/OL.22.00013210.1364/OL.22.000132 ↗
24. NanoScribe GmbH.http://www.nanoscribe.de/en/. accessed: January 2017.
25. 10.1002/adma.20120058410.1002/adma.201200584 ↗
26. 10.1063/1.143245010.1063/1.1432450 ↗
27. 10.1063/1.220047610.1063/1.2200476 ↗
28. 10.1021/acsnano.5b0586410.1021/acsnano.5b05864 ↗
29. 10.1364/OL.26.00188810.1364/OL.26.001888 ↗
30. 10.1063/1.169149210.1063/1.1691492 ↗
31. 10.1088/0960-1317/20/6/06501610.1088/0960-1317/20/6/065016 ↗
32. 10.1186/s40580-014-0007-510.1186/s40580-014-0007-5 ↗
33. 10.1364/JOSA.51.00012310.1364/JOSA.51.000123 ↗
34. 10.1063/1.186424910.1063/1.1864249 ↗
35. 10.1117/12.225809010.1117/12.2258090 ↗
36. 10.1103/PhysRevB.53.174910.1103/PhysRevB.53.1749 ↗
37. 10.1038/nphoton.2016.12110.1038/nphoton.2016.121 ↗
38. Schmitt R. · Mikroproduktion · 2014 · 5 · 37
39. 10.1364/OPEX.14.00081010.1364/OPEX.14.000810 ↗
40. 10.1063/1.346497910.1063/1.3464979 ↗
41. 10.1016/j.nantod.2010.08.00710.1016/j.nantod.2010.08.007 ↗
42. 10.1002/adma.20100054210.1002/adma.201000542 ↗
43. 10.1038/ncomms1176310.1038/ncomms11763 ↗
44. 10.1088/0960-1317/20/9/09500210.1088/0960-1317/20/9/095002 ↗
45. 10.1116/1.363401310.1116/1.3634013 ↗
46. 10.1116/1.364376110.1116/1.3643761 ↗
47. 10.1016/j.mee.2015.02.01410.1016/j.mee.2015.02.014 ↗
48. 10.1088/0963-9659/6/6/00610.1088/0963-9659/6/6/006 ↗
49. 10.1116/1.496125010.1116/1.4961250 ↗
50. 10.1021/cr00096a00110.1021/cr00096a001 ↗
51. 10.1116/1.58407110.1116/1.584071 ↗
52. 10.1116/1.59124210.1116/1.591242 ↗
53. 10.1016/0169-4332(95)00013-510.1016/0169-4332(95)00013-5 ↗
54. 10.1016/S0168-9002(00)00239-410.1016/S0168-9002(00)00239-4 ↗
55. 10.1117/12.25181910.1117/12.251819 ↗
56. 10.1116/1.220999710.1116/1.2209997 ↗
57. Nobuo U. · 1989
58. 10.1006/adnd.1993.101310.1006/adnd.1993.1013 ↗
59. 10.1007/s00339-011-6553-310.1007/s00339-011-6553-3 ↗
60. 10.1063/1.9694010.1063/1.96940 ↗
61. 10.1016/0040-6090(92)90923-Y10.1016/0040-6090(92)90923-Y ↗
62. Foster B. · Am. Lab. · 2012 · 44 · 24
63. 10.1088/0960-1317/24/5/05501010.1088/0960-1317/24/5/055010 ↗
64. 10.1364/OME.5.00045610.1364/OME.5.000456 ↗