Advanced Manufacturing Panel at IMAT 2023
Source abstract
Abstract
Abstract This article presents highlights from a panel session held at International Materials, Applications & Technologies (IMAT) 2023. Experts from ASM affiliate societies shared insights on the impact of new materials and manufacturing technologies in their respective fields. The panel was moderated by David Furrer, Pratt & Whitney. The panelists were Thomas Ackerson, Blue Origin LLC (representing the Failure Analysis Society); Arvind Agarwal, College of Engineering and Computing, Florida International University (Thermal Spray Society); Marvin Barnes, NASA (Heat Treating Society); Jay Demarest, IBM (Electronic Device Failure Analysis Society); and Laura Moyer, Lehigh University (International Metallographic Society).
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Research context
OpenAlex topics: Manufacturing Process and Optimization · Industrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis
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