Cold Spray: Advanced Characterization Methods—Scanning Electron Microscopy
Source abstract
Abstract
Abstract In cold spray characterization, scanning electron microscopy is used to analyze feedstock powders for particle size, distribution, shape, and chemical composition prior to spraying. SEM is used extensively to characterize coating chemistry via energy-dispersive x-ray spectroscopy (EDS). Coating thickness and interface contour can be characterized in a manner that makes SEM an indispensable and versatile tool for evaluating coating integrity in the as-sprayed condition, as well as in developing an understanding of bonding to the substrate.
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Research context
OpenAlex topics: High-Temperature Coating Behaviors · Catalytic Processes in Materials Science · Semiconductor materials and devices
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