Cold Spray: Advanced Characterization Methods—Optical Microscopy
Source abstract
Abstract
Abstract Optical or light microscopy uses the visible or near-visible portion of the electromagnetic spectrum and is one of the oldest characterization techniques. With any cold spray coating, it is the first characterization process used to evaluate and optimize process variables.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: High-Temperature Coating Behaviors · Semiconductor materials and devices · Copper Interconnects and Reliability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
GE Power , GE India Technology Center, Bangalore, India
References
Reference metadata was not supplied for this record.