journal article·2020-04-01

Advanced Microscopy Techniques for New Insights in Materials and Technology

Natasha Erdman, Jennifer Misuraca, Donna Guarrera

AM&P Technical Articles· Volume 178· Issue 3
Publisher page

Abstract

Abstract New electrical, mechanical, and chemical testing capabilities give scanning electron microscopes the feel of a self-contained “nano-laboratory.” Several developments in SEM technology allow new and more flexible approaches to the analysis of novel systems, such as Li battery-related materials, nanostructured and nanoporous materials, and novel approaches to 3D analysis.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures

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Affiliations

Jeol USA.

References

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