Readying advanced composites for the microscope
Source abstract
Abstract
Concerns related to the proper preparation of composite specimens for microstructural analysis are examined. Proper preparation will minimize the amount of surface and subsurface damage at each stage of the procedure so that the microstructural features of the final-polished specimen can be accurately determined as a function of the composite's response to processing, testing, or service conditions. This requires that an optimum combination of abrasive type, size, and bond be applied during each grinding, lapping, and polishing step. Machine settings, such as polishing speed, force, and relative polishing direction, are also important. Guidelines are given for each step of the six-stage specimen preparation process: sectioning, planar grinding, sample integrity, polishing, and etching.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Advanced X-ray and CT Imaging · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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