Transmission Kikuchi Diffraction in the Scanning Electron Microscope: Orientation Mapping on the Nanoscale
Source abstract
Abstract
Abstract By changing a setup and using electron transparent samples, hundreds of laboratories worldwide have access to a characterization technique, transmission Kikuchi diffraction, that measures grain sizes and orientations in nanocrystalline materials.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Optical Coatings and Gratings · Surface Roughness and Optical Measurements · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
The University of Sydney , Sydney, Australia
References
Reference metadata was not supplied for this record.