3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy (Adv. Mater. Interfaces 2/2024)
Source abstract
Abstract
Dielectric Constant Measurement In article 2300503, Khaled Kaja and co-workers present a new approach to simultaneously measure the dielectric constants of buried structures and interfaces by combining peak force tapping quantitative Nano-mechanical mapping (PF QNM) and frequency-modulated Kelvin probe force microscopy (FM-KPFM). The developed method paves the way for 3D-imaging of dielectric constants of composite materials and heterostructures.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Analytical Chemistry and Sensors · Smart Materials for Construction
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Affiliations
Laboratoire National de Métrologie et d'Essais (LNE) Trappes 78197 France
Laboratory of Physics and Modeling, EDST Lebanese University Tripoli 1300 Lebanon
Bruker Nano Surfaces Santa Barbara CA 93117 USA
College of Engineering and Technology American University of the Middle East Kuwait
Laboratory of Physics of Condensed Matter LPMC Université de Picardie Jules Verne Amiens 80093 France
References
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