Defect Chemistry: Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry (Adv. Mater. Interfaces 6/2021)
Source abstract
Abstract
The defect chemistry of La1−xSrxFeO3−δ (LSF) thin films is unveiled for intermediate-to-low temperature range using a novel in situ ellipsometry approach. The evolution of the concentration of holes in the LSF thin films with oxygen partial pressure and temperature is obtained. This technique pushes the limits for tracking the defect chemistry in LSF thin films to lower temperature. More details can be found in article number 2001881 by Francesco Chiabrera, Albert Tarancón, and co-workers.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advancements in Solid Oxide Fuel Cells
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Affiliations
Department of Advanced Materials for Energy Applications Catalonia Institute for Energy Research (IREC) Jardins de les Dones de Negre 1, Sant Adrià del Besòs Barcelona 08930 Spain
Centre for Cooperative Research on Alternative Energies (CIC energiGUNE) Basque Research and Technology Alliance (BRTA) Alava Technology Park, Albert Einstein 48 Vitoria‐Gasteiz 01510 Spain
Department of Electrochemical Energy Storage ICREA Passeig Lluís Companys 23 Barcelona 08010 Spain
References
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