DataVXAdvanced Materials InterfacesPaper
journal article·2021-03

Surface Bending Strain: Nanoscale Analysis of Surface Bending Strain in Film Substrates for Preventing Fracture in Flexible Electronic Devices (Adv. Mater. Interfaces 5/2021)

Ryo Taguchi, Norihisa Akamatsu, Kohei Kuwahara, Kayoko Tokumitsu, Yoshiaki Kobayashi, Masayuki Kishino, Keita Yaegashi, Jun Takeya, Atsushi Shishido

Advanced Materials Interfaces· Volume 8· Issue 5
Publisher page
Source abstract

Abstract

How are strains in bending polymer films measured? In article number 2001662 by Norihisa Akamatsu, Jun Takeya, Atsushi Shishido, and co-workers, the surface-labeled grating method is proposed for quantitatively measuring the surface bending strain in flexible polymer films. Using this method, the specialty substrate that exhibits small bending strains is designed, enabling the development of mechanically durable flexible electronic devices.
Source: openalex_inverted_index · Quality: baseline

Research context

PolymersNanomaterials

OpenAlex topics: Advanced Sensor and Energy Harvesting Materials

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Affiliations

Laboratory for Chemistry and Life Science Institute of Innovative Research Tokyo Institute of Technology Yokohama 226‐8503 Japan

Department of Chemical Science and Engineering School of Materials and Chemical Technology Tokyo Institute of Technology Meguro Tokyo 152‐8552 Japan

Material Innovation Research Center (MIRC) Graduate School of Frontier Sciences The University of Tokyo Kashiwa Chiba 277‐8561 Japan

Department of Advanced Materials Science Graduate School of Frontier Sciences The University of Tokyo 5‐1‐5 Kashiwanoha, Kashiwa Chiba 277‐8561 Japan

References

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