DataVXAdvanced Materials InterfacesPaper
journal article·2021-05

Fast Atomic Diffusion: Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe2O3 Films Quantified Using Buried Isotopic Tracer Layers (Adv. Mater. Interfaces 9/2021)

Tiffany C. Kaspar, Sandra D. Taylor, Kayla H. Yano, Timothy G. Lach, Yadong Zhou, Zihua Zhu, Aaron A. Kohnert, Evan K. Still, Peter Hosemann, Steven R. Spurgeon, Daniel K. Schreiber

Advanced Materials Interfaces· Volume 8· Issue 9
Publisher page
Source abstract

Abstract

Fast atomic diffusion through structural defects in Fe2O3 is directly imaged for the first time at the sub-nanometer level by atom probe tomography. In article number 2001768 by Tiffany C. Kaspar and co-workers, model epitaxial and defect-rich thin films of Fe2O3 are deposited with molecular beam epitaxy, incorporating a tracer layer of 18O within the film itself. Atomic-level self-diffusion is then visualized and quantified in 3D by APT, revealing ≈104 times faster oxygen diffusion along structural flaws than through the pristine lattice.
Source: openalex_inverted_index · Quality: baseline

Research context

Nanomaterials

OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques

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Affiliations

Physical and Computational Sciences Directorate Pacific Northwest National Laboratory Richland WA 99354 USA

Energy and Environment Directorate Pacific Northwest National Laboratory Richland WA 99354 USA

Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory Richland WA 99354 USA

Material Science and Technology Division Los Alamos National Laboratory Los Alamos NM 87545 USA

Department of Nuclear Engineering University of California Berkeley CA 94720 USA

References

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