journal article·2017-01Open access

Crystalline Insulators: Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films (Adv. Mater. Interfaces 2/2017)

Omur E. Dagdeviren, Chao Zhou, Ke Zou, Georg H. Simon, Stephen D. Albright, Subhasish Mandal, Mayra D. Morales‐Acosta, Xiaodong Zhu, Sohrab Ismail‐Beigi, Frederick J. Walker, Charles H. Ahn, Udo D. Schwarz, Eric I. Altman

Advanced Materials Interfaces· Volume 4· Issue 2

Abstract

The surface states of topological crystalline insulators (TCIs) are protected by crystal symmetry, suggesting that symmetry breaking surface defects may be used to tailor the surface states. Eric I. Altman and co-workers show that the epitaxial growth of a TCI creates such defects which modulate the surface electronic properties over mesoscopic and atomic scales in article 1601011.
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Research context

OpenAlex topics: Diamond and Carbon-based Materials Research · Laser-Ablation Synthesis of Nanoparticles · Advanced Semiconductor Detectors and Materials

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Affiliations

Center for Research on Interface Structures and Phenomena (CRISP) Yale University New Haven CT 06520 USA

Department of Mechanical Engineering and Materials Science Yale University New Haven CT 06520 USA

Department of Applied Physics Yale University New Haven CT 06520 USA

Department of Chemical and Environmental Engineering Yale University New Haven CT 06520 USA

Department of Physics Yale University New Haven CT 06520 USA

References

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