journal article·2018-07

Metal on Graphenated Metal for VLSI Interconnects

Udit Narula, Cher Ming Tan, Eng Soon Tok

Advanced Materials Interfaces· Volume 5· Issue 13
Publisher page

Abstract

Abstract Copper is running out of steam for modern very large scale integration (VLSI) technology and therefore there is a need for paradigm shift to a more reliable interconnect structure. Metal–graphene–metal structure is suggested to be a suitable candidate. A new method is devised wherein graphene synthesized on copper foil can act as a reducing agent for electroless plating of copper without the need of any other chemical species, making such novel interconnect structure feasible in practice. The superiority of such interconnect structure can be seen both experimentally and simulationally. Such deposition is also possible for synthesized or transferred graphene on other metals such as nickel, titanium, aluminum, gold, silver, cobalt, palladium, having metal–graphene interface separation of less than 3.2–3.6 Å as derived from its fundamental principle.
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Research context

OpenAlex topics: Graphene research and applications · Low-power high-performance VLSI design · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Center for Reliability Sciences & Technologies Chang Gung University 259, Wen‐Hua 1st Road Kwei‐Shan Tao‐Yuan Taiwan 33302 Republic of China

Center for Reliability Sciences & Technologies Department of Electronic Engineering Chang Gung University 259, Wen‐Hua 1st Road Kwei‐Shan Tao‐Yuan Taiwan 33302 Republic of China

Electronic Materials Growth and Interface Characterization (eMaGIC) Laboratory Department of Physics National University of Singapore 2 Science Drive 3 Singapore 117551 Singapore

Funding

Ministry of Science and Technology, Taiwan

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