A New Analytical Method for Extracting Precise Structural Parameters of Epitaxial Graphene from Moiré Patterns
Source abstract
Abstract
A new analytical method to determine the most important two parameters, rotational angle (Rθ) and strain (ΔaGr/aGr) of graphene on metal substrate, from scanning tunneling microscope images is presented. Epitaxial graphene on Ir(111) and Pt(111) was investigated by this method, which demonstrates that rotational angle and strain are not independent factors. Rather, these components influence each other to stabilize the graphene–metal interaction thermodynamically.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Graphene research and applications · Surface and Thin Film Phenomena · Chemical and Physical Properties of Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Surface and Interface Science Laboratory RIKEN 2‐1 Hirosawa Wako Saitama 351‐0198 Japan
Center for Multidimensional Carbon Materials Institute of Basic Science UNIST‐gil 50 Ulsan 689‐798 South Korea
Department of Chemistry Ulsan National Institute of Science and Technology UNIST‐gil 50 Ulsan 689‐798 South Korea
References (26)
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