journal article·2024-03Open access

Annealing Temperature Effect on the Physical Properties of NiO Thin Films Grown by DC Magnetron Sputtering (Adv. Mater. Interfaces 9/2024)

Sergei Timoshnev, Alexey Kazakin, Ksenia Shubina, Valentina Andreeva, Elizaveta Fedorenko, Aleksandra Koroleva, Evgeniy Zhizhin, Olga Koval, Alina Kurinnaya, Alexander Shalin, Vjaceslavs Bobrovs, Yakov Enns

Advanced Materials Interfaces· Volume 11· Issue 9

Abstract

Nickel Oxide Thin Films In article 2300815, Yakov Enns and co-workers produce thin films of nickel oxide (NiO) by magnetron sputtering. The modification of the properties of NiO films by annealing at various temperatures and environments is reported. The difference in the effect of film annealing depending on the modes of their initial growth is shown.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials

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Affiliations

Alferov University Saint‐Petersburg 194021 Russia

Ioffe Institute Saint‐Petersburg 194021 Russia

Peter the Great St.Petersburg Polytechnic University Saint‐Petersburg 195251 Russia

Research Park Saint Petersburg State University Saint Petersburg 199034 Russia

Center for Photonics and 2D Materials Moscow Institute of Physics and Technology Dolgoprudny 141700 Russia

Faculty of Physics Moscow State University Moscow 119991 Russia

Institute of Telecommunications Riga Technical University Riga 1048 Latvia

References

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