journal article·2020-10Open access

Plasmonic Supercrystals with a Layered Structure Studied by a Combined TEM‐SAXS‐XCCA Approach

Florian Schulz, Fabian Westermeier, Francesco Dallari, Verena Markmann, Holger Lange, Gerhard Grübel, Felix Lehmkühler

Advanced Materials Interfaces· Volume 7· Issue 19

Abstract

Abstract Supercrystals composed of plasmonic nanoparticles constitute a promising material platform for tailored light‐matter interactions. The optimization of their optical properties requires precise syntheses and a detailed structural characterization that addresses not only the basic geometrical parameters but also the degree of order. Herein, plasmonic supercrystals with a well‐defined layered structure are studied by a combined transmission electron microscopy, small‐angle X‐ray scattering and X‐ray cross‐correlation analysis (TEM‐SAXS‐XCCA) approach. It is demonstrated that scanning small‐angle x‐ray scattering (SAXS) data can unambiguously be assigned to the number of crystalline layers by comparison with complementary transmission electron microscopy (TEM) experiments on the same regions of interest. A small but significant increase of the lattice constant with increasing number of layers and a high degree of orientational order irrespective of the number of layers is found. This points to specifics of the supercrystal formation mechanism that could be utilized to improve the control of self‐assembly for supercrystal geometries with subnanometer precision.
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Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · ZnO doping and properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Physical Chemistry University of Hamburg Grindelallee 117 Hamburg 20146 Germany

The Hamburg Centre for Ultrafast Imaging (CUI) Luruper Chaussee 149 Hamburg 22761 Germany

Deutsches Elektronen‐Synchrotron DESY Notkestr. 85 Hamburg 22607 Germany

Funding

Deutsche Forschungsgemeinschaft

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