Interface Stress for Bidirectional Frequency Tuning of Prebuckled Vanadium Dioxide MEMS Resonators

Abstract Interface stress between structural materials and thin film coatings has a significant influence on the resonant frequency of microelectromechanical system (MEMS) resonators. In this work, the axial stress on different types of buckled bridge MEMS resonator structures is controlled through the solid‐to‐solid phase transition of a VO₂ thin film coating. The devices have identical dimensions, but different buckling orientations and profiles due to the combined effect of overetching and residual thermal stress mismatch. Thermal actuation is used to tune the resonant frequency of the device, but the changes in frequency are found to be dependent on the type of buckling for the device. Thermal actuation is achieved by applying an electrical current to integrated heaters, or by uniform substrate heating. Bidirectional tunability is found when substrate heating is used, while Joule heating shows a monotonic change in frequency. This phenomenon can be attributed to the transition in boundary conditions, where the turning points are indicated by the prominent changes in buckling amplitude. In addition, devices with opposite buckling orientations exhibit different tuning behaviors which can be explained by different bending moments induced by beam stress interface modification.