Seeing Down to the Bottom: Nondestructive Inspection of All‐Polymer Solar Cells by Kelvin Probe Force Microscopy
Source abstract
Abstract
The material composition in a bulk heterojunction (BHJ) of an all-polymer solar cell is analyzed down to the bottom surface by Kelvin probe force microscopy. The phase separation of the composites both on the top and at the bottom of a BHJ can be measured and reconstructed with this easy-to-use approach in a nondestructive way. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Force Microscopy Techniques and Applications · Nanowire Synthesis and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of Functional Nano and Soft Materials (FUNSOM) Soochow University Suzhou 215123 P. R. China
Light Technology Institute Karlsruhe Institute of Technology (KIT) Engesserstrasse 13 76131 Karlsruhe Germany
Institute for Microstructure Technology Karlsruhe Institute of Technology (KIT) Hermann‐von‐Helmholtz‐Platz 1 76344 Eggenstein‐Leopoldshafen Germany
Funding
National Natural Science Foundation of China
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