journal article·2016-09

Seeing Down to the Bottom: Nondestructive Inspection of All‐Polymer Solar Cells by Kelvin Probe Force Microscopy

Zequn Cui, Jianxia Sun, Dominik Landerer, Christian Sprau, Richard Thelen, Alexander Colsmann, Hendrik Hölscher, Wanli Ma, Lifeng Chi

Advanced Materials Interfaces· Volume 3· Issue 18
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Abstract

The material composition in a bulk heterojunction (BHJ) of an all-polymer solar cell is analyzed down to the bottom surface by Kelvin probe force microscopy. The phase separation of the composites both on the top and at the bottom of a BHJ can be measured and reconstructed with this easy-to-use approach in a nondestructive way. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
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Research context

OpenAlex topics: Organic Electronics and Photovoltaics · Force Microscopy Techniques and Applications · Nanowire Synthesis and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Functional Nano and Soft Materials (FUNSOM) Soochow University Suzhou 215123 P. R. China

Light Technology Institute Karlsruhe Institute of Technology (KIT) Engesserstrasse 13 76131 Karlsruhe Germany

Institute for Microstructure Technology Karlsruhe Institute of Technology (KIT) Hermann‐von‐Helmholtz‐Platz 1 76344 Eggenstein‐Leopoldshafen Germany

Funding

National Natural Science Foundation of China

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