Mapping the elemental distribution in sol‐gel derived ceramics
Source abstract
Abstract
Elemental dispersive x‐ray (EDX) composition distribution mapping using a scanning electron microscope (SEM) provides information about samples that is complementary to that obtained from X‐ray diffraction. Examples are given (e.g., Ba and Cu maps of YBa2Cu3O7 − δ, see figure) to demonstrate the usefulness of this technique in evaluating the homogeneity of sol‐gel products and in elucidating elemental zoning (see also cover picture). magnified image
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Research context
OpenAlex topics: Physics of Superconductivity and Magnetism · Advanced Condensed Matter Physics · Mesoporous Materials and Catalysis
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References (16)
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