journal article·1991-01

Characterization and modification of conducting substrates for ultrathin organic films by scanning tunneling microscopy

Stefan Buchholz, Harald Fuchs, Jürgen P. Rabe

Advanced Materials· Volume 3· Issue 1
Publisher page

Abstract

Communication: The structure of an organic film of molecular thickness depends strongly on the surface properties of the underlying substrate. STM is a method which enables a substrate surface to be characterized and controlled as demonstrated in the figure, where the letter “U” etched with an STM tip into a highly oriented pyrolytic graphite (HOPG) surface is shown. The holes, which are around 5 nm in diameter, could serve as nucleation sites for an organic adsorbate phase. magnified image
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Molecular Junctions and Nanostructures

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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