Correction to: Interlaboratory Reproducibility of Contour Method Data Analysis and Residual Stress Calculation
Source abstract
Abstract
The original version of this article has been corrected to include authors middle initials in the author list. The details given in this correction are correct.
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Source: openaire · Quality: needs review · Source record ↗
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Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Non-Destructive Testing Techniques
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