Graphene: Probing Bilayer Grain Boundaries in Large‐Area Graphene with Tip‐Enhanced Raman Spectroscopy (Adv. Mater. 7/2017)
Source abstract
Abstract
A twisted stacking bilayer structure of grain boundaries in large-area graphene is revealed by Mun Seok Jeong and co-workers in article number 1603601 from high-spatial-resolution (<18 nm) correlated analysis of topography, near-field scattering, and hyperspectral tip-enhanced Raman spectroscopy (TERS) imaging. The demonstrated analytical results of bilayer grain boundaries deliver an informative guide toward the design of future graphene devices; furthermore, this approach will be generally applicable to a range of two-dimensional materials beyond graphene.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Graphene research and applications · Graphene and Nanomaterials Applications · Silicon Nanostructures and Photoluminescence
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Affiliations
Department of Physics Department of Chemistry, and JILA University of Colorado Boulder CO 80309 USA
Department of Chemistry University of North Carolina Chapel Hill NC 27599 USA
Center for Integrated Nanostructure Physics Institute for Basic Science Sungkyunkwan University Suwon 440‐746 Republic of Korea
Department of Energy Science Sungkyunkwan University Suwon 440‐746 Republic of Korea
References
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