journal article·2001-07

Recording at the Nanometer Scale on p-Nitrobenzonitrile Thin Films by Scanning Tunneling Microscopy

D. X. Shi, Y. L. Song, D. B. Zhu, H. X. Zhang, S. S. Xie, S. J. Pang, H.-J. Gao

Advanced Materials· Volume 13· Issue 14
Publisher page

Abstract

A data storage density of at least 1014 bits/cm2 is possible using p-nitrobenzonitrile as the data storage medium and scanning tunneling microscopy (STM) as the recording method. This represents the smallest mark size among all the organic thin films studied by these authors. The Figure shows a typical STM image of a recorded pattern.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Nanofabrication and Lithography Techniques

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