DataVXAdvanced MaterialsPaper
journal article·2013-08-27Open access

Unexpected Dominance of Vertical Dislocations in High‐Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning (Adv. Mater. 32/2013)

Anna Marzegalli, Fabio Isa, Heiko Groiss, Elisabeth Müller, Claudiu V. Falub, Alfonso G. Taboada, Philippe Niedermann, Giovanni Isella, Friedrich Schäffler, Francesco Montalenti, Hans von Känel, Leo Miglio

Advanced Materials· Volume 25· Issue 32
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Source abstract

Abstract

An innovative strategy in dislocation analysis is described by Anna Marzegalli et al. on page 4408 demonstrating that vertical dislocations dominate in thick Ge layers on silicon substrates.
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Semiconductor materials and interfaces · Advanced Surface Polishing Techniques

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