journal article·1995-05

Real space evidence for reversible metal–metal bond rearrangement induced by AFM tip force

Hardy Bengel, Hans‐Joachim Cantow, Sergei N. Magonov, Myung‐Hwan Whongbo

Advanced Materials· Volume 7· Issue 5
Publisher page

Abstract

The reversible rearrangement of weak metal‒metal bonds in layered transition metal chalcogenides is shown to be induced by the force exerted by the tip of an atomic force microscope. The figure shows how the ribbon chains which make up the layers of NbTe2 are reversibly switched by 60° by increasing ad decreasing the force at the tip. magnified image
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Mechanical and Optical Resonators

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (26)

Show source-provided references
1. 10.1021/j100082a03410.1021/j100082a034 ↗
2. 10.1002/adma.1994006090510.1002/adma.19940060905 ↗
3. 10.1016/0039-6028(94)90170-810.1016/0039-6028(94)90170-8 ↗
4. H.Bengel H.‐J.Cantow S. N.Magonov H.Hillebrecht G.Thiele W.Liang M.‐H.Whangbo Surf: Sci. 1995 submitted for publication.
5. 10.1016/0039-6028(94)90334-410.1016/0039-6028(94)90334-4 ↗
6. 10.1080/0001873750010139110.1080/00018737500101391 ↗
7. 10.1007/978-94-010-1433-5_110.1007/978-94-010-1433-5_1 ↗
8. 10.1021/ja00050a04410.1021/ja00050a044 ↗
9. 10.1016/0022-4596(92)90304-E10.1016/0022-4596(92)90304-E ↗
10. Coleman R. V. · 1993 · 349
11. 10.1080/0001873880010143910.1080/00018738800101439 ↗
12. 10.1021/ar00006a00310.1021/ar00006a003 ↗
13. 10.1021/ja00062a04810.1021/ja00062a048 ↗
14. 10.1021/ja00021a00110.1021/ja00021a001 ↗
15. 10.1021/ja00096a04810.1021/ja00096a048 ↗
16. 10.1016/0039-6028(90)90086-N10.1016/0039-6028(90)90086-N ↗
17. 10.1016/0039-6028(94)90339-510.1016/0039-6028(94)90339-5 ↗
18. The force constants of the cantilevers were calculated from the relationships given in [18] on the basis of their resonance frequencies experimentally determined by using the tapping‐mode head of Nanoscope III. The operational forces were then determined from the experimental force curves. To increase the range of the applied forces the probe was engaged with a reference signal of − 12 V and force changes were achieved by increasing the set‐point level from −8 to + 8 V. This allowed' us to carry out AFM measurements with applied forces in the 70–200 nN range. A rough estimate of the pressure the tip applies to the sample surface can be made on the basis of a Herzian contact model between a spherical tip of radius 20 nm and an elastic half‐space (Eq. 1 of [19]). We assume that Poisson's ratio is 0.5 for the tip and sample Young's modulus is 350 GPa for the tip (typical for a hard material) and 40 GPa for the sample (typical for a layered material) [20]. Then at the load of 200 nN it is estimated that the radius of the circular tip‐sample contact area is about 4 nm so the tip‐force is about 4 GPa. All AFM images are presented without off‐line filtering.
19. 10.1107/S0365110X6600050110.1107/S0365110X66000501 ↗
20. 10.1002/adma.1994006050410.1002/adma.19940060504 ↗
21. H.Bengel S. N.Magonov D.Jung J.Ren M.‐H.Whangbo unpublished work.
22. Le Chatelier H. · Ann. Mines · 1888 · 13 · 200
23. Braun F. · Z. Physik Chem. · 1887 · 1 · 25910.1515/zpch-1887-0131 ↗
24. 10.1116/1.57652010.1116/1.576520 ↗
25. 10.1063/1.10564910.1063/1.105649 ↗
26. 10.1103/PhysRevB.43.472810.1103/PhysRevB.43.4728 ↗