Scanning probe surface modification
Source abstract
Abstract
Nanometer‐scale manipulation of surfaces by scanning probe devices has expanded amazingly since the first reports in the mid‐1980s. General approaches to scanning probe microscope induced surface patterning are discussed. The Figure shows a scanning electron micrograph of an STM‐defined pattern of a HS(CH2)17CH3 monolayer resist on a Au(111) substrate. magnified image
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Molecular Junctions and Nanostructures · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (20)
Show source-provided references
1. 10.1063/1.88122610.1063/1.881226 ↗
2. 10.1038/scientificamerican1089-9810.1038/scientificamerican1089-98 ↗
3. 10.1002/adma.1991003021210.1002/adma.19910030212 ↗
4. 10.1007/978-94-015-7871-4_110.1007/978-94-015-7871-4_1 ↗
5. 10.1038/344524a010.1038/344524a0 ↗
6. 10.1126/science.259.5102.172410.1126/science.259.5102.1724 ↗
7. 10.1021/ja00031a02010.1021/ja00031a020 ↗
8. 10.1021/la00078a02510.1021/la00078a025 ↗
9. 10.1051/jphyscol:198627410.1051/jphyscol:1986274 ↗
10. 10.1116/1.58597810.1116/1.585978 ↗
11. 10.1021/la00027a00210.1021/la00027a002 ↗
12. T. S.Corbitt R. M.Crooks M. J.Hampden‐Smith C. B.Ross J. K.Schoer unpublished.
13. 10.1016/0304-3991(92)90462-S10.1016/0304-3991(92)90462-S ↗
14. 10.1103/PhysRevLett.65.241810.1103/PhysRevLett.65.2418 ↗
15. 10.1021/ja00351a06310.1021/ja00351a063 ↗
16. 10.1021/ja00183a04910.1021/ja00183a049 ↗
17. 10.1146/annurev.pc.43.100192.00225310.1146/annurev.pc.43.100192.002253 ↗
18. All experiments were performed using a Digital Instruments NanoScope STM. The image shown in Figure 1 a appears somewhat blurred because the tip was damaged during the surface modification step.
19. 10.1021/cm00022a00910.1021/cm00022a009 ↗
20. Energy dispersive spectroscopic results obtained for several different regions in Fig. 3 indicate the presence of Cu exclusively in the STM‐defined patterns but not on the portions of the surface that were not exposed to the STM tip. However we believe Cu also deposits on the material that is apparent along the slow‐scan axis of the patterns.