Direct Imaging of Defect Structures in Pentacene Nanocrystals
Source abstract
Abstract
High-resolution electron microscopy of nanocrystalline pentacene films, obtained by disruption of powder between glass slides, provides a method for direct visualization of structural defects. By imaging edge dislocations (see Figure) and grain boundaries, insight into the way the crystal layers accommodate distortions by lattice bending is gained.
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Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Carbon Nanotubes in Composites · Force Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (22)
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