Dielectric Properties of Ultrathin CaF ₂ Ionic Crystals

Adv. Mater. 2020, 32, 2002525 In the originally published article, affiliations for Chao Wen and Fei Hui that should have been included in the affiliation list were missing. Chao Wen was a visiting researcher at Materials Science & Engineering Department, Guangdong Technion – Israel Institute of Technology where some of the experiments detailed in the paper were performed and Fei Hui joined the Technion – Israel Institute of Technology during the development of these experiments as a post-doctoral researcher. Accordingly, the affiliation list in the main article is revised as below: C. Wen, Dr. F. Hui, Prof. M. Lanza Institute of Functional Nano & Soft Materials Collaborative Innovation Center of Suzhou Nano Science & Technology Soochow University 199 Ren-Ai Road, Suzhou 215123, China E-mail: mlanza@suda.edu.cn C. Wen Materials Science & Engineering Department Guangdong Technion – Israel Institute of Technology 241 Daxue Road, Shantou, Guangdong Province 515603, China Dr. A. G. Banshchikov, Dr. Y. Y. Illarionov, Prof. N. S. Sokolov Ioffe Institute Polytechnicheskaya 26, Saint Petersburg 194021, Russia Dr. Y. Y. Illarionov, T. Knobloch, Prof. T. Grasser Institute for Microelectronics (TU Wien) Gusshausstrasse 27–29, Vienna 1040, Austria Prof. W. Frammelsberger Department of Mechanical Engineering and Mechatronics Deggendorf Institute of Technology Dieter-Görlitz-Platz 1, Deggendorf 94469, Germany F. Hui Department of Materials Science and Engineering Technion – Israel Institute of Technology Haifa 3200003, Israel In addition, the following additional acknowledgements are declared: “The Austrian Science Fund FWF (grants no. I2606-N30, I4123-N30, and P29119-N35), and the Russian Foundation for Basic Research (grant no. 18-57-80006 BRICS_t) are also acknowledged. Y.Y.I. is a member of Mediterranean Institute of Fundamental Physics.”