Probing Local Electronic Transport at the Organic Single‐Crystal/Dielectric Interface
Source abstract
Abstract
We demonstrate that scanning Kelvin probe microscopy (SKPM), an atomic force microscopy (AFM)-based potentiometric technique, allows for an in-depth exploration of the local electrical potential at the organic/ dielectric interface in sub-μm thick organic single crystals (OSCs), opening novel perspectives for a deeper understanding of intrinsic charge transport, interfacial and contact effects in semi-conducting organic single crystals.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Molecular Junctions and Nanostructures · Force Microscopy Techniques and Applications · Organic Electronics and Photovoltaics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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