Comments on ‘Electric‐Field‐Assisted Growth of Highly Uniform and Oriented Gold Nanotriangles on Conducting Glass Substrates’
Source abstract
Abstract
AFM artifacts: Recent results by Sajanlal and Pradeep on the electric-field-assisted growth of highly uniform and oriented gold nanotriangles appear to provide a simple route to the size-, shape-, and orientation-controlled synthesis of nano structures. In our view, however, the triangle patterns observed in the AFM images are not real surface features but artifacts produced by a broken or contaminated AFM tip.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Gold and Silver Nanoparticles Synthesis and Applications · Nanomaterials and Printing Technologies · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. 10.1002/adma.20070179010.1002/adma.200701790 ↗
2. For AFM measurements the dynamic force mode (DFM) used in ref. [1] is also commonly referred to as tapping mode.
3. SPM Training Notebook Software Version 3.0 Veeco Instruments Inc USA 2003 p.58.
4. Sajanlal and Pradeep reported in ref. [1] that the average full width at half maximum of the gold nanotriangles prepared after one hour growth is (375 ± 15) nm. However a careful examination of Fig. 2A and Fig. S6 in ref. [1] reveals that the average edge‐length of the gold nanotriangles is in the range of 350–450 nm.
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