Resistive Switching Phenomena in Li_{x}CoO₂ Thin Films

Alec Moradpour; Olivier Schneegans; Sylvain Franger; Alexandre Revcolevschi; Raphaël Salot; Pascale Auban‐Senzier; Claude Pasquier; Efthymios Svoukis; John Giapintzakis; Oana Dragos; Vasile‐Cristian Ciomaga; Pascal Chrétien

doi:10.1002/adma.201101800

journal article·2011-09-22

Resistive Switching Phenomena in Li_xCoO₂ Thin Films

Alec Moradpour, Olivier Schneegans, Sylvain Franger, Alexandre Revcolevschi, Raphaël Salot, Pascale Auban‐Senzier, Claude Pasquier, Efthymios Svoukis, John Giapintzakis, Oana Dragos, Vasile‐Cristian Ciomaga, Pascal Chrétien

Advanced Materials· Volume 23· Issue 36

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Source abstract

Abstract

A substantial resistive switching of LixCoO2 mixed-conductor thin films is observed for the first time. The occurrence of possible bipolar switching in these oxide thin films is by current–voltage curves, investigated by conducting-probe atomic force microscopy (CP-AFM). The films are incorporated into an {Au/LixCoO2/p++Si} device and exhibit a significant resistive-switching process involving a ratio of over four orders of magnitude.

Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Neuroscience and Neural Engineering

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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