Direct Observation of Inversion Domain Boundaries of GaN on c‐Sapphire at Sub‐ångstrom Resolution
Source abstract
Abstract
Inversion domain boundaries (IDBs) of GaN are studied by a high-resolution technique. The IDB separates adjacent domains of opposite polarity. The image shows a GaN IDB in the [bar;2110] projection. The theoretical IDB structure fits the experimentally obtained structure well. The inset is an image acquired from a very thin region on the right side of the IDB. It can indicate the polarity of GaN directly.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials · ZnO doping and properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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