journal article·2024-12Open access

Atom Probe Tomography: a Local Probe for Chemical Bonds in Solids

Oana Cojocaru‐Mirédin, Yuan Yu, Jan Köttgen, Tanmoy Ghosh, Carl‐Friedrich Schön, Shuai Han, Chongjian Zhou, Min Zhu, Matthias Wuttig

Advanced Materials· Volume 36· Issue 50

Abstract

Abstract Atom probe tomography is frequently employed to characterize the elemental distribution in solids with atomic resolution. Here the potential of this technique to locally probe chemical bonds is reviewed and discussed. Two processes characterize the bond rupture in laser‐assisted field emission, the probability of molecular ions (PMI), i.e., the probability that molecular ions are evaporated instead of single (atomic) ions, and the probability of multiple events (PME), i.e., the correlated field‐evaporation of more than a single fragment upon laser‐ or voltage pulse excitation. Here it is demonstrated that one can clearly distinguish solids with metallic, covalent, and metavalent bonds based on their bond rupture, i.e., their PME and PMI values. These findings open new avenues in understanding and designing advanced materials, since they allow a quantification of bonds in solids on a nanometer scale, as will be shown for several examples. These possibilities would even justify calling the present approach bonding probe tomography (BPT).
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Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Diamond and Carbon-based Materials Research · Force Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Physikalisches Institut IA RWTH Aachen University Sommerfeldstraße 14 52074 Aachen Germany

INATECH University of Freiburg Georges‐Köhler Allee 102 79110 Freiburg Germany

Department of Sciences and Humanities Rajiv Gandhi Institute of Petroleum Technology (RGIPT) Jais Amethi UP 229304 India

State Key Laboratory of Solidification Processing Northwestern Polytechnical University Xi'an 710072 China

National Key Laboratory of Materials for Integrated Circuits Shanghai Institute of Microsystems and Information Technology Chinese Academy of Sciences Shanghai 200050 China

Peter Grünberg Institute – JARA‐Institute Energy Efficient Information Technology (PGI‐10) Forschungszentrum Jülich GmbH Wilhelm‐Johnen‐Straße 52428 Jülich Germany

Funding

Bundesministerium für Bildung und Forschung · Deutsche Forschungsgemeinschaft

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