journal article·2023-08Open access

Machine Learning for Optical Scanning Probe Nanoscopy

Xinzhong Chen, Suheng Xu, Sara Shabani, Yueqi Zhao, Matthew Fu, Andrew J. Millis, Michael M. Fogler, Abhay N. Pasupathy, Mengkun Liu, D. N. Basov

Advanced Materials· Volume 35· Issue 34

Abstract

Abstract The ability to perform nanometer‐scale optical imaging and spectroscopy is key to deciphering the low‐energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic substances, and aqueous biological samples. These tasks can be accomplished by the scattering‐type scanning near‐field optical microscopy (s‐SNOM) technique that has recently spread to many research fields and enabled notable discoveries. Herein, it is shown that the s‐SNOM, together with scanning probe research in general, can benefit in many ways from artificial‐intelligence (AI) and machine‐learning (ML) algorithms. Augmented with AI‐ and ML‐enhanced data acquisition and analysis, scanning probe optical nanoscopy is poised to become more efficient, accurate, and intelligent.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Near-Field Optical Microscopy · Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Physics and Astronomy Stony Brook University Stony Brook NY 11794 USA

Department of Physics Columbia University New York NY 10027 USA

Department of Physics University of California at San Diego La Jolla CA 92093‐0319 USA

National Synchrotron Light Source II Brookhaven National Laboratory Upton NY 11973 USA

Funding

U.S. Department of Energy · Office of Science · Basic Energy Sciences · National Aeronautics and Space Administration

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