journal article·2007-09-17

High Throughput Surface Characterisation of a Combinatorial Material Library

A. J. Urquhart, D. G. Anderson, M. Taylor, M. R. Alexander, R. Langer, M. C. Davies

Advanced Materials· Volume 19· Issue 18
Publisher page

Abstract

The figure shows a schematic representing the information that can be obtained from the surface of each polymer sample within the microarrayed library. High throughput surface analytical techniques used include X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectrometry and water contact angle measurement.
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Research context

OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices

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References (21)

Show source-provided references
1. 10.1016/S0039-6028(01)01587-410.1016/S0039-6028(01)01587-4 ↗
2. 10.1016/0167-5729(92)90013-210.1016/0167-5729(92)90013-2 ↗
3. 10.1016/j.surfrep.2003.12.00110.1016/j.surfrep.2003.12.001 ↗
4. 10.1039/b511848b10.1039/b511848b ↗
5. D. Briggs M. P. Seah Practical Surface Analysis: Auger and X‐ray Photoelectron Spectroscopy Wiley Chichester UK1990.
6. 10.1016/S0142-9612(03)00159-510.1016/S0142-9612(03)00159-5 ↗
7. G. Barnes Interfacial science: An Introduction Oxford University Press Oxford2005.
8. 10.1002/adma.20050114210.1002/adma.200501142 ↗
9. 10.1002/marc.20030018410.1002/marc.200300184 ↗
10. 10.1038/nbt98110.1038/nbt981 ↗
11. 10.1016/j.biomaterials.2004.11.05210.1016/j.biomaterials.2004.11.052 ↗
12. 10.1002/sia.74018090810.1002/sia.740180908 ↗
13. A. J. Urquhart D. G. Anderson M. Taylor M. R. Alexander R. Langer M. C. Davies unpublished.
14. 10.1016/S0169-4332(02)00794-810.1016/S0169-4332(02)00794-8 ↗
15. ION‐TOF The Munster High Mass Resolution Static SIMS Library Vol. 1 ION‐TOF GmbH Munster2000.
16. A. J. Urquhart D. G. Anderson M. Taylor M. R. Alexander R. Langer M. C. Davies unpublished.
17. 10.1002/(SICI)1097-4636(199810)42:1<66::AID-JBM9>3.0.CO;2-M10.1002/(SICI)1097-4636(199810)42:1<66::AID-JBM9>3.0.CO;2-M ↗
18. 10.1002/marc.20030023410.1002/marc.200300234 ↗
19. 10.1021/la070100j10.1021/la070100j ↗
20. 10.1002/adma.20050271910.1002/adma.200502719 ↗
21. 10.1016/j.apsusc.2006.02.27710.1016/j.apsusc.2006.02.277 ↗