DataVXAdvanced MaterialsPaper
journal article·2015-08Open access

Rapid and Nondestructive Identification of Polytypism and Stacking Sequences in Few‐Layer Molybdenum Diselenide by Raman Spectroscopy

Xin Lu, M. Iqbal Bakti Utama, Junhao Lin, Xin Luo, Yanyuan Zhao, Jun Zhang, Sokrates T. Pantelides, Wu Zhou, Su Ying Quek, Qihua Xiong

Advanced Materials· Volume 27· Issue 30
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Source abstract

Abstract

Various combinations of interlayer shear modes emerge in few-layer molybdenum diselenide grown by chemical vapor deposition depending on the stacking configuration of the sample. Raman measurements may also reveal polytypism and stacking faults, as supported by first principles calculations and high-resolution transmission electron microscopy. Thus, Raman spectroscopy is an important tool in probing stacking-dependent properties in few-layer 2D materials.
Source: openalex_inverted_index · Quality: baseline

Research context

NanomaterialsMaterials processing

OpenAlex topics: 2D Materials and Applications · Perovskite Materials and Applications · MXene and MAX Phase Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Division of Physics and Applied Physics School of Physical and Mathematical Sciences Nanyang Technological University Singapore 637371 Singapore

Department of Physics and Astronomy Vanderbilt University Nashville TN 37235 USA

Materials Science and Technology Division Oak Ridge National Laboratory Oak Ridge TN 37831 USA

Department of Physics Centre for Advanced 2D Materials and Graphene Research Centre National University of Singapore Singapore 117546 Singapore

Institute of High Performance Computing Singapore 138632 Singapore

NOVITAS, Nanoelectronics Centre of Excellence School of Electrical and Electronic Engineering Nanyang Technological University Singapore 639798 Singapore

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