Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub‐Ångström Emitter Localization
Source abstract
Abstract
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Diamond and Carbon-based Materials Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (23)
Show source-provided references
1. 10.1007/BF0295617310.1007/BF02956173 ↗
2. 10.1038/nphys153610.1038/nphys1536 ↗
3. 10.1126/science.113187110.1126/science.1131871 ↗
4. 10.1038/nphys196910.1038/nphys1969 ↗
5. 10.1038/nature0727910.1038/nature07279 ↗
6. 10.1021/nl071630310.1021/nl0716303 ↗
7. 10.1038/nphoton.2011.5410.1038/nphoton.2011.54 ↗
8. 10.1038/nature0727810.1038/nature07278 ↗
9. 10.1002/smll.20100090210.1002/smll.201000902 ↗
10. 10.1038/nphoton.2009.210.1038/nphoton.2009.2 ↗
11. 10.1209/0295-5075/86/1400110.1209/0295-5075/86/14001 ↗
12. 10.1103/PhysRevLett.107.01760110.1103/PhysRevLett.107.017601 ↗
13. 10.1038/nphys177410.1038/nphys1774 ↗
14. Siyushev P. · Appl. Phys. Lett. · 2010 · 97
15. Marseglia L. · Appl. Phys. Lett. · 2011 · 98
16. Hadden J. P. · Appl. Phys. Lett. · 2010 · 97
17. 10.1364/OE.16.00415410.1364/OE.16.004154 ↗
18. 10.1366/00037020778022085910.1366/000370207780220859 ↗
19. 10.1366/000370201195219010.1366/0003702011952190 ↗
20. 10.1111/j.1365-2818.1993.tb03315.x10.1111/j.1365-2818.1993.tb03315.x ↗
21. 10.1038/nphys199910.1038/nphys1999 ↗
22. 10.1038/nature1049710.1038/nature10497 ↗
23. 10.1038/nmeth.129110.1038/nmeth.1291 ↗