Effect of Aromatic SAMs Molecules on Graphene/Silicon Schottky Diode Performance
Source abstract
Abstract
Au/n-Si/Graphene/Au Schottky diodes were fabricated by transferring atmospheric pressure chemical vapor deposited (APCVD) graphene on silicon substrates. Graphene/n-Si interface properties were improved by using 5-[(3-methylphenyl)(phenyl) amino]isophthalic acid (MePIFA) and 5-(diphenyl)amino]isophthalic acid (DPIFA) aromatic self-assembled monolayer (SAM) molecules. The surface morphologies of modified and non-modified films were investigated by atomic force microscopy and scanning electron microscopy. The surface potential characteristics were obtained by Kelvin-probe force microscopy and found as 0.158 V, 0.188 V and 0,383 V as a result of SAMs modification. The ideality factors of n-Si/Graphene, n-Si/MePIFA/Graphene and n-Si/DPIFA/Graphene diodes were found as 1.07, 1.13 and 1.15, respectively. Due to the chain length of aromatic organic MePIFA and DPIFA molecules, also the barrier height B values of the devices were decreased. While the barrier height of n-Si/Graphene diode was obtained as 0.931 eV, n-Si/MePIFA/Graphene and n-Si/DPIFA/Graphene diodes have barrier height of 0.820 and 0.720 eV, respectively.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and interfaces · Graphene research and applications · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (34)
Show source-provided references
1. 10.1021/nl200758b10.1021/nl200758b ↗
2. 10.1126/science.115799610.1126/science.1157996 ↗
3. 10.1038/nmat306410.1038/nmat3064 ↗
4. 10.1126/science.115696510.1126/science.1156965 ↗
5. 10.1063/1.278967310.1063/1.2789673 ↗
6. 10.1126/science.116713010.1126/science.1167130 ↗
7. 10.1039/b920539j10.1039/b920539j ↗
8. 10.1002/smll.20100155510.1002/smll.201001555 ↗
9. 10.1103/PhysRevX.2.01100210.1103/PhysRevX.2.011002 ↗
10. 10.1021/nl501735k10.1021/nl501735k ↗
11. 10.1063/1.491972710.1063/1.4919727 ↗
12. 10.1021/nl104364c10.1021/nl104364c ↗
13. 10.1002/adma.20090438310.1002/adma.200904383 ↗
14. 10.3938/jkps.66.2210.3938/jkps.66.22 ↗
15. 10.1063/1.37348210.1063/1.373482 ↗
16. 10.1021/nl801827v10.1021/nl801827v ↗
17. 10.1038/nature0771910.1038/nature07719 ↗
18. 10.1021/nl902790r10.1021/nl902790r ↗
19. 10.12693/APhysPolA.123.45610.12693/APhysPolA.123.456 ↗
20. 10.12693/APhysPolA.123.45910.12693/APhysPolA.123.459 ↗
21. 10.1021/nl100587e10.1021/nl100587e ↗
22. 10.1016/j.apsusc.2014.05.18110.1016/j.apsusc.2014.05.181 ↗
23. 10.1021/jp410961m10.1021/jp410961m ↗
24. 10.1016/j.carbon.2015.06.06710.1016/j.carbon.2015.06.067 ↗
25. 10.1021/nl104000b10.1021/nl104000b ↗
26. 10.1021/nl201699j10.1021/nl201699j ↗
27. 10.1021/nn202829y10.1021/nn202829y ↗
28. 10.1039/c2jm33653g10.1039/c2jm33653g ↗
29. Schroder D. K. , Semiconductor material and device characterization; John Wiley & Sons, 2006.10.1002/0471749095 ↗
30. 10.1063/1.493964810.1063/1.4939648 ↗
31. 10.1016/j.carbon.2015.10.07510.1016/j.carbon.2015.10.075 ↗
32. 10.1016/j.synthmet.2011.09.00710.1016/j.synthmet.2011.09.007 ↗
33. Sze S. M. Ng K. K. , Physics of semiconductor devices; John Wiley & Sons, 2006.10.1002/0470068329 ↗
34. 10.1063/1.9735910.1063/1.97359 ↗