journal article·2022-10Open access

Exploring Interfaces Through Synchrotron Radiation Characterization Techniques: A Graphene Case (Adv. Funct. Mater. 42/2022)

Yiran Ding, Haiwen Shi, Mengqi Zeng, Lei Fu

Advanced Functional Materials· Volume 32· Issue 42

Abstract

Synchrotron Radiation Characterization A high-energy, bright, coherent and collimating light emitted by the synchrotron radiation source illuminates the way of graphene research. In article number 2202469, Mengqi Zeng, Lei Fu, and co-workers introduce these characterized interface structures of graphene, including interlayer spacing, layer number, stacking order, and heterogeneous atom doping, which can be displayed clearly and nondestructively.
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Research context

OpenAlex topics: Graphene research and applications · Graphene and Nanomaterials Applications · Electron and X-Ray Spectroscopy Techniques

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Affiliations

The Institute for Advanced Studies Wuhan University Wuhan 430072 China

College of Chemistry and Molecular Sciences Wuhan University Wuhan 430072 China

References

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