journal article·2020-12Open access

CHARACTERIZATION OF SILVER CONTENT UPON PROPERTIES OF NANOSTRUCTURED NICKEL OXIDE THIN FILMS

Al-Nahrain Nanorenewable Energy Research Centre, Al-Nahrain University, Baghdad, Iraq, H. T. SALLOOM, E. H. HADI, Department of Physics, College of Education, Mustansiriyah University, Baghdad, Iraq, N. F. HABUBI, Department of Physics, College of Education, Mustansiriyah University, Baghdad, Iraq, S. S. CHIAD, Department of Physics, College of Education, Mustansiriyah University, Baghdad, Iraq, M. JADAN, Department of Physics, College of Science, Imam Abdulrahman Bin Faisal University, P.O. Box 1982, 31441 Dammam, Saudi Arabia, J. S. ADDASI, Department of Physics, College of Science, Imam Abdulrahman Bin Faisal University, P.O. Box 1982, 31441 Dammam, Saudi Arabia

Abstract

The influence of two silver contents (2% and 4%) on NiO films were studied in terms of structural and optical properties. Ag doped NiO films were grown on glass and n-type silicon substrates heated at 400C by chemical pyrolysis method. Optical transmission measurements showed up to 60% transparency in the visible area for undoped NiO and decreased with increasing Ag content. X-ray diffraction assures the existence of epitaxial growth with the c-axis. Average particle size, surface roughness and energy gap were decreased also. Rectifying characteristics of junctions deposited films on n-type silicon has been analyzed. Transparent conductive films showed excellent properties to be adopted for solar cells and optical sensors.
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Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · Gas Sensing Nanomaterials and Sensors · ZnO doping and properties

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