Carrier lifetimes in SiC, studied by time resolved photoluminescence spectroscopy
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OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices · Copper Interconnects and Reliability
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References (11)
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1. W.J. Choyke, Diamond and Related Materials (this proceedings).
2. Henry · Appl. Phys. Lett. · 1994 · 65 · 245710.1063/1.112706 ↗
3. Naumov · Sov. Phys. Semicond. · 1989 · 23 · 630
4. Anikin · Sov. Phys. Semicond. · 1991 · 25 · 289
5. Danishevskii · Semiconductors · 1996 · 30
6. Kordina · Appl. Phys. Lett. · 1995 · 66 · 18910.1063/1.113130 ↗
7. Kordina · Appl. Phys. Lett. · 1996 · 69 · 67910.1063/1.117804 ↗
8. Kordina · Appl. Phys. Lett. · 1995 · 66 · 137310.1063/1.113205 ↗
9. Bergman · Phys. Rev. · 1994 · B 50 · 830510.1103/PhysRevB.50.8305 ↗
10. Son · Appl. Phys. Lett. · 1994 · 65 · 268710.1063/1.112962 ↗
11. Schmid · Phys. Stat. Solids · 1977 · 84 · 52910.1002/pssb.2220840216 ↗