journal article·2013-06

Computational methods for materials characterization by electron tomography

Jose-Jesus Fernandez

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Abstract

Electron tomography (ET) is a powerful imaging technique that enables thorough three-dimensional (3D) analysis of materials at the nanometre and even atomic level. The recent technical advances have established ET as an invaluable tool to carry out detailed 3D morphological studies and derive quantitative structural information. Originally from life sciences, ET was rapidly adapted to this field and has already provided new and unique insights into a variety of materials. The principles of ET are based on the acquisition of a series of images from the sample at different views, which are subsequently processed and combined to yield the 3D volume or tomogram. Thereafter, the tomogram is subjected to 3D visualization and post-processing for proper interpretation. Computation is of utmost importance throughout the process and the development of advanced specific methods is proving to be essential to fully take advantage of ET in materials science. This article aims to comprehensively review the computational methods involved in these ET studies, from image acquisition to tomogram interpretation, with special focus on the emerging methods.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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