Unraveling the Gain Mechanism in High Performance Solution‐Processed PbS Infrared PIN Photodiodes
Source abstract
Abstract
High gain and low dark current solution‐processed colloidal PbS quantum dots infrared (IR) PIN photodetectors with IR sensitivity up to 1500 nm are demonstrated. The low dark current is due to the P‐I‐N structure with both electron and hole blockers. The high gain in our IR photodiodes is due to the enhancement of electron tunneling injection through the 1,1‐bis[(di‐4‐tolylamino) phenyl]cyclohexane (TAPC) electron blocker under IR illumination resulting from a distorted electron blocking barrier in the presence of photo‐generated holes trapped in the TAPC electron blocker. It is further found that the trap states in the TAPC layer are generated by the Ag atoms penetrated in the TAPC layer during the thermal evaporation process. The resulting photodetectors have a high detectivity value of 7 × 1013 Jones, which is even higher than that of a commercial InGaAs photodiode.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Advanced Semiconductor Detectors and Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Materials Science and Engineering University of Florida Gainesville FL 32611 USA
References (35)
Show source-provided references
1. 10.1063/1.170974810.1063/1.1709748 ↗
2. 10.1063/1.9283310.1063/1.92833 ↗
3. 10.1063/1.35493110.1063/1.354931 ↗
4. 10.1063/1.157198110.1063/1.1571981 ↗
5. 10.1016/S1350-4495(00)00061-X10.1016/S1350-4495(00)00061-X ↗
6. 10.1109/T-ED.1980.1983510.1109/T-ED.1980.19835 ↗
7. 10.1063/1.33946810.1063/1.339468 ↗
8. 10.1063/1.11152710.1063/1.111527 ↗
9. 10.1038/nnano.2008.20610.1038/nnano.2008.206 ↗
10. 10.1021/am405001910.1021/am4050019 ↗
11. 10.1038/nature0485510.1038/nature04855 ↗
12. 10.1002/adom.20140002310.1002/adom.201400023 ↗
13. 10.1002/adfm.20110253210.1002/adfm.201102532 ↗
14. 10.1021/cm100622910.1021/cm1006229 ↗
15. 10.1038/nnano.2008.31310.1038/nnano.2008.313 ↗
16. 10.1002/adfm.20100132810.1002/adfm.201001328 ↗
17. 10.1002/adfm.20140209410.1002/adfm.201402094 ↗
18. 10.1021/cm200051j10.1021/cm200051j ↗
19. 10.1021/nn500897c10.1021/nn500897c ↗
20. 10.1002/adfm.20100132810.1002/adfm.201001328 ↗
21. 10.1063/1.356143710.1063/1.3561437 ↗
22. 10.1016/j.solmat.2011.04.03710.1016/j.solmat.2011.04.037 ↗
23. 10.1021/nl200704h10.1021/nl200704h ↗
24. 10.1017/CBO978113902275010.1017/CBO9781139022750 ↗
25. 10.1126/science.117670610.1126/science.1176706 ↗
26. 10.1063/1.300689010.1063/1.3006890 ↗
27. 10.1063/1.301871610.1063/1.3018716 ↗
28. 10.4028/www.scientific.net/DDF.237-240.99310.4028/www.scientific.net/DDF.237-240.993 ↗
29. 10.1063/1.184984510.1063/1.1849845 ↗
30. 10.1063/1.235715510.1063/1.2357155 ↗
31. 10.1038/nphoton.2007.14710.1038/nphoton.2007.147 ↗
32. 10.1016/S0079-6727(02)00024-110.1016/S0079-6727(02)00024-1 ↗
33. Liu H. C. · Opto‐Electron. Rev. · 2003 · 11 · 1
34. 10.1021/am401560510.1021/am4015605 ↗
35. 10.1063/1.35130910.1063/1.351309 ↗