journal article·2026-06

Effect of top electrode on interfacial layer formation and polarization switching kinetics in post-deposition annealed Hf0.5Zr0.5O2 capacitors

Yu Bin Park, Tae Hyun Jung, Beomjun Kim, Jeonglyul Kim, Jung Kyu Lee, Sang Won An, Chang-Su Woo, Beomjong Kim, Hyung-Suk Jung, Hyobin Yoo, Sang Mo Yang

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OpenAlex topics: Ferroelectric and Negative Capacitance Devices · Ferroelectric and Piezoelectric Materials · Semiconductor materials and devices

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References (45)

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