journal article·2009-03

Development of scanning field emission current microscopy

W.H. Han, T.Y. Park, C.J. Kang, S.I. Lee, Young Jin Choi

Current Applied Physics· Volume 9· Issue 2
Publisher page

Abstract

Abstract Spatial uniformity and durability of field emission are main issues in carbon nanotube (CNT) field emission devices fabricated by a screen-printing process. In this paper, we propose a novel method to visualize field emission sites of CNT films two-dimensionally by adopting scanning probe microscopy. While an anode probe with a small tip diameter of
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Carbon Nanotubes in Composites · Force Microscopy Techniques and Applications · Mechanical and Optical Resonators

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References (7)

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